Light & Dark Field Super Depth 3D Measuring Instrument JBM‑HM2000

LIGHT DARK FIELD SUPER DEPTH 3D MEASURING INSTRUMENT JBM-HM2000

3D stereoscopic modeling, quickly generating super depth of field images, viewing at any angle of 540 degrees. Measurement of arbitrary profile height and micrometer size measurement.

Generate 3D / 2D Model Diagrams, 3D Graphic Color Height Maps, Multi-Profile and Multi-Point Height Measurements.

• 3D super EDF Microscope Camera: No computer required, perform 3D observation and measurement directly. Equip with metallographic, stereo and reflective microscopes with ±2µm measuring accuracy for 2D&3D with 10x objective lens.
• Core technology creates a strong linkage performance: Heterogeneous system possessing ability for high-speed data calculation with three computing algorithms (Super depth of field, 3D modeling, Edge recognition).
• Four-in-one system: High-speed camera, Imaging analysis software, Z-axis motorized stage, High-performance host.
• Real-time EDF for clear microscopic observation: Capturing a clear and correct full-frame focusing image without angle deviation or uneven focal plane.
• Real-time WDR to eliminate strong reflection: Calculates data in real time from multiple images of different brightness levels on metallic surfaces.
• 3D Matrix & 360° Modeling: Capture-Advanced imaging-EDF&3D function module. Observe real scene or pseudo-color model with 360° rotation.
• Rich 3D measurement functions: Z-axis measurement accuracy and repeatability is ±2µm and ±1µm.